000			00322nam a2200133Ia 4500
999			_c336670 _d336670
003			OSt
005			20220112144008.0
008			220112b ||||| |||| 00| 0 eng d
040			_c0
082			_a621.38195MIL
100			_aMiller D.M. Ed. _94195
245			_aDevlopments in Integrated Circuit Testing
942			_2ddc _cBK